Used FIB Buying Guide: Helios vs Crossbeam Checks
Compare used FIB and FIB-SEM offers by exact model, source, installed options and TEM sample tests. Check service and software terms before buying.
For a used focused ion beam (FIB) purchase, define the work first: cross-sectioning, TEM sample preparation, milling or another documented workflow. Then compare the exact Helios or Crossbeam configuration offered, including installed options and a demonstration on representative samples.
Helios vs Crossbeam: start with the exact model
Thermo Fisher describes the Helios 5 EXL as a FIB-SEM for semiconductor TEM sample preparation. ZEISS describes the Crossbeam 550 Samplefab as a FIB-SEM with an automated TEM sample-preparation workflow.
These are model-specific examples, not specifications for an older used Helios or Crossbeam. Ask for the offered model's original documentation and installed-options list. Do not rank every system in one family above the other based on a current product brochure.
For additional comparison questions, see the Helios and Crossbeam dual-beam guide.
What to match in a used FIB quote
Ask each seller for the same evidence package:
- Exact model, serial number, column identification and ion-source type.
- Installed detectors, sample stage, holders, gas-injection equipment and micromanipulator, where included.
- Control-software version, installed workflow modules and written license-transfer terms.
- Source-use records, vacuum history, maintenance reports and unresolved service issues.
- Site requirements, shipping preparation and the proposed installation provider.
For a source or column replacement, request the applicable manufacturer part number and written confirmation of fit. Do not infer compatibility from a generic RF-generator or ion-source listing.
TEM preparation acceptance: inspect the result
Ask your microscopy lead to select representative material and define the target region, lamella requirements and downstream measurement method. Have the seller perform the agreed preparation sequence on the quoted instrument.
Record the operating conditions, elapsed preparation time, operator interventions and any failed attempts. Request the resulting samples and images, with measurements against your pre-agreed criteria for thickness, usable area, damage and site accuracy.
If repeatability matters to your workflow, agree on a repeat sequence rather than accepting a single selected image. For a non-TEM application, define an equivalent task-specific test and measurable result before comparing systems.
Check installation and service before choosing a seller
Request a site survey against the instrument's installation documentation. Have qualified personnel assess the proposed room and utility arrangements, then obtain a written installation and acceptance scope.
Ask who will service the exact model, what is excluded and how the provider will handle unavailable parts. Obtain explicit confirmation of software access and any reinstallation or transfer charges before including them in your budget.
The focused ion beam equipment buying guide offers another checklist for your RFQ. Use the used semiconductor equipment evaluation guide to organize the inspection record.
Compare complete offers, not headline prices
Request separate quotes for the instrument, missing options, source or column work, software, deinstallation, packing, freight, installation and acceptance. Ask the supplier to state the remedy if the delivered system cannot repeat the agreed demonstration.
Choose the offer that demonstrates your workflow and has an acceptable service plan. Send your sample type, required task, destination and acceptance criteria with the RFQ; request a configuration record before approving the instrument.