Various (FormFactor, MPI)
Used Probe Card for Wafer Testing
Market Price
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Request Quote →Last verified: 2026-05-11
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Pricing
Price on request — quote in 4 hours
Market pricing for Used Probe Card for Wafer Testing moves with condition and availability. Our sourcing team will quote current pricing within 4 business hours.
How much does a used Used Probe Card for Wafer Testing cost in 2026?
Pricing for used Used Probe Card for Wafer Testing units varies by condition and configuration. Contact us for current 2026 market pricing. Get a quote.
Used Various (FormFactor, MPI) Test Equipment vs. buying new: is it worth it in 2026?
Most buyers in 2026 choose used for cost and speed. OEM new is preferred when full factory support or first-article qualification is required.
What's included with a used Used Probe Card for Wafer Testing from Caladan Semi?
Every unit Caladan sources in 2026 is inspected and documented before sale. Here's what you get:
- ✓Functional test report and inspection photos
- ✓Available documentation (manuals, service records where available)
- ✓Availability: Available to Source — contact for current inventory
- ✓Export compliance documentation (EAR99 or ECCN classification provided)
Probe Card Specifications and Compatible Tools
Key specs: contact resistance <10mΩ, probe force 50–200g, voltage rating up to 5V, frequency support up to 1GHz. Most units operate at 24–48V DC and support thermal cycling from -50°C to 300°C.
Compatible tools include:
- FormFactor 5500 Series (2010–2015 production)
- MPI X5 Prober (2012–2018 models)
- Aehr Test Systems MX1200 (2014–2020)
Warning: Do not install on Teradyne J750 systems (PN: J750-PC-STD); incompatible probe card interface geometry causes test head misalignment.
What to Check Before Buying a Used Probe Card in 2026
- Contact resistance: Measure with a micro-ohmmeter (e.g., Fluke 1587). Reject if >15mΩ at 10mA.
- Probe tip wear: Use a digital microscope (100x magnification). Blunting >10% of original tip radius invalidates high-precision applications.
- Insulation resistance: Test with a megohmmeter (e.g., Megger MIT540). Minimum 1×10¹² ohms at 500V DC.
- Thermal cycling history: Request logs. Avoid units with >500 cycles unless rated for >1,000 cycles (check OEM spec sheets).
- Alignment accuracy: Use a coordinate measuring machine (CMM). Deviation >5 microns at 2,048 I/Os indicates warping.
Units older than 2018 may lack modern ESD protection layers; confirm with a surface resistance tester.
FAQ
Q: Are used probe cards reliable for high-volume production?
A: Yes, if <5 years old, with <10% tip wear and verified calibration logs.
Recent Market Listings
Updated Sep 30No recent market activity for Used Probe Card for Wafer Testing.
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